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X-Ray Structure Analysis by Siegrist, Theo

X-Ray Structure Analysis

$53.99 $73.99

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Contributors:
Theo Siegrist
Publisher:
de Gruyter
Binding:
Paperback
Book Category:
Technology & Engineering, Science
Book Subcategory:
Materials Science, Chemistry, Physics
Book Topic:
Inorganic, Crystallography
Series:
de Gruyter Textbook
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Shipping & Return +
The product is eligible for a complimentary return within 30 days from the date of purchase. Furthermore, individual items are shipped within 24 hours of receiving the order.
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Rating and Reviews +
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Specifications +
Release Date:
2021-12-03
ISBN 13:
9783110610703
Weight:
1.1 lbs
Size:
9.40 x 6.60 x 0.70 inches
Pages:
250
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Mint Condition +

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