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The Stanford Revision And Extension Of The Binet-Simon Scale For Measuring Intelligence

The Stanford Revision And Extension Of The Binet-Simon Scale For Measuring Intelligence - Hardcover

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The Stanford Revision And Extension Of The Binet-Simon Scale For Measuring Intelligence

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Availability:In StockContributor:Lewis M. Terman, Grace Lyman, George OrdahlPublish date:6/25/2007Pages:188
Languages:EnglishPublisher:Kessinger PublishingISBN-13:9780548364611ISBN-10:0548364613UPC:9780548364611Book Category:Literary CollectionsBook Subcategory:EssaysSize:9.00 x 6.00 x 0.56 inchesWeight:0.449Product ID:SC5MJDBVCY
This scarce antiquarian book is a facsimile reprint of the original. Due to its age, it may contain imperfections such as marks, notations, marginalia and flawed pages. Because we believe this work is culturally important, we have made it available as part of our commitment for protecting, preserving, and promoting the world's literature in affordable, high quality, modern editions that are true to the original work.
Languages:EnglishPublisher:Kessinger PublishingISBN-13:9780548364611ISBN-10:0548364613UPC:9780548364611Book Category:Literary CollectionsBook Subcategory:EssaysSize:9.00 x 6.00 x 0.56 inchesWeight:0.449Product ID:SC5MJDBVCY
Publisher: Kessinger Publishing

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