Surprise Castle
/Books
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization - Paperback

by Fred Stevie
$57.99
$79.95
-27%
Quantity
01

Pay over time for orders over $35.00 with

Availability:In StockContributor:Fred SteviePublish date:2015-09-15Pages:277
Language:EnglishPublisher:Momentum PressISBN-13:9781606505885ISBN-10:1606505882UPC:9781606505885Book Category:Technology & EngineeringBook Subcategory:Materials ScienceSize:9.00 x 6.00 x 0.61 inchesWeight:0.8598Product ID:SC332RHYXF
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Language:EnglishPublisher:Momentum PressISBN-13:9781606505885ISBN-10:1606505882UPC:9781606505885Book Category:Technology & EngineeringBook Subcategory:Materials ScienceSize:9.00 x 6.00 x 0.61 inchesWeight:0.8598Product ID:SC332RHYXF
Senior Researcher, North Carolina State University
Publisher: Momentum Press

Contributor(s)

Fred Stevie

Author

Fred Stevie

Free shipping on orders over $75. Standard shipping takes 3-7 business days. Returns accepted within 30 days of purchase.

Recently Viewed

View All