Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization - Paperback
by Fred Stevie
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Languages:EnglishPublisher:Momentum PressISBN-13:9781606505885ISBN-10:1606505882UPC:9781606505885Book Category:Technology & EngineeringBook Subcategory:Materials ScienceSize:9.00 x 6.00 x 0.61 inchesWeight:0.8598Product ID:SC332RHYXF
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Languages:EnglishPublisher:Momentum PressISBN-13:9781606505885ISBN-10:1606505882UPC:9781606505885Book Category:Technology & EngineeringBook Subcategory:Materials ScienceSize:9.00 x 6.00 x 0.61 inchesWeight:0.8598Product ID:SC332RHYXF
Senior Researcher, North Carolina State University
Publisher: Momentum Press
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