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Particle-Induced X-Ray Emission Spectrometry (Pixe)

Particle-Induced X-Ray Emission Spectrometry (Pixe) - Hardcover

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Languages:EnglishPublisher:Wiley-InterscienceISBN-13:9780471589440ISBN-10:0471589446UPC:9780471589440Book Category:ScienceBook Subcategory:ChemistryBook Topic:AnalyticSize:9.25 x 6.30 x 1.11 inchesWeight:0.844Product ID:SCMJ1321BJ

The authoritative handbook to exploiting the full power and versatility of PIXE-- now and in the next century

Respected for its practical accuracy and detection range of parts per million, particle-induced X-ray emission has enjoyed a secure place in the analytical arsenal of the nuclear physics laboratory. Yet, its undeniable analytical potential in other areas of science has scarcely been tapped. This unique reference, from PIXE specialists in biomedicine, atmospheric science, earth science, and art and archaeology, features a user-based look at PIXE's conceptual basics and methodology, with a view toward new and creative analytical work.

Touching on every facet of PIXE technology, from basic instrumentation, specimens, the characteristics of X-ray spectroscopy, standardization of quantitative analysis, to the accuracy of PIXE analysis and its limits of detection, the book offers an unprecedented look at the newer uses of PIXE in such areas as:

  • Applications of macro- and micro-PIXE in medicine, zoology, and botany
  • Analysis of atmospheric aerosols
  • Geological and extra-terrestrial material
  • Analysis of gem stones, pottery, glass, and alloys
  • As an exploratory tool for pigments and paintings and "paper-like" materials

Complete with a comparative look contrasting PIXE with more conventional forms of analysis, this important reference is key to grasping the technique's practical specifics and exploiting its full analytical potential.

Languages:EnglishPublisher:Wiley-InterscienceISBN-13:9780471589440ISBN-10:0471589446UPC:9780471589440Book Category:ScienceBook Subcategory:ChemistryBook Topic:AnalyticSize:9.25 x 6.30 x 1.11 inchesWeight:0.844Product ID:SCMJ1321BJ
SVEN A. E. JOHANSSON received his PhD from the University of Lund in 1952. He held appointments at the National Atomic Commission, Chalmers University, and the Lund Institute of Technology. At Lund, Dr. Johansson occupied the Chair of Nuclear Physics and served as both Director of LIT and Vice Chancellor of the University of Lund. He was a member of the Swedish Academy of Engineering Science and the Royal Swedish Academy of Science, and served on the Nobel Committee for Physics. Dr. Johansson passed away in 1994.

JOHN L. CAMPBELL is the Dean of the College of Physical and Engineering Science at the University of Guelph, Ontario. He joined the University of Guelph in 1968 and in 1977, was appointed Professor of Physics. Dr. Campbell received his PhD from the University of Glasgow, Scotland, and in 1982, was awarded a DSc from the same institution.

KLAS G. MALMQVIST is Dean of the School of Engineering Physics at the Lund Institute of Technology. Since 1990, Dr. Malmqvist has been a Professor of Physics and Chair of Applied Nuclear Physics. Dr. Malmqvist received his PhD in nuclear physics from the Lund Institute of Technology in 1981 and qualified as Docent in Engineering Physics in 1986.
Publisher: Wiley-Interscience

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