Logic Testing and Design for Testability - Paperback
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Availability:In StockContributor:Hideo FujiwaraSeries:MIT Press ClassicsAudience:Young AdultPublish date:1985-07-31Pages:284
Language:EnglishPublisher:MIT PressISBN-13:9780262561990ISBN-10:262561999UPC:9780262561990Book Category:ComputersBook Subcategory:Computer ScienceSize:8.90 x 5.90 x 0.80 inchesWeight:0.9017Product ID:SCBWVZEWPV
Logic Testing and Design for Testability
Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.
Today's computers must perform with increasing reliability, which in turn depends on the problem of determining whether a circuit has been manufactured properly or behaves correctly. However, the greater circuit density of...
Language:EnglishPublisher:MIT PressISBN-13:9780262561990ISBN-10:262561999UPC:9780262561990Book Category:ComputersBook Subcategory:Computer ScienceSize:8.90 x 5.90 x 0.80 inchesWeight:0.9017Product ID:SCBWVZEWPV
Fujiwara, Hideo: - Hideo Fujiwara is an associate professor in the Department of Electronics and Communication, Meiji University.
Publisher: MIT Press
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