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Introduction to Synthetic Aperture Radar: Concepts and Practice

Introduction to Synthetic Aperture Radar: Concepts and Practice - Hardcover

by E. David Jansing
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Availability:In StockContributor:E. David JansingPublish date:2021-04-13Pages:208
Language:EnglishPublisher:McGraw-Hill CompaniesISBN-13:9781260458961ISBN-10:1260458962UPC:9781260458961Book Category:Technology & EngineeringBook Subcategory:Electrical, RadarSize:9.40 x 7.30 x 0.70 inchesWeight:1.2015Product ID:SCYTHD95CK

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Explore the principles and applications of synthetic aperture radar

This comprehensive guide offers a solid grounding in synthetic aperture radar (SAR) fundamentals and techniques. Written by a remote sensing and signal processing expert, Introduction to Synthetic Aperture Radar: Concepts and Practice clearly explains data collection, image formation, error correction, and image quality. You will get concise descriptions of commonly used image formation algorithms, including the Range-Doppler Algorithm (RDA) and the Polar Formatting Algorithm (PFA). Continuous wave LFM systems, interferometry, polarimetry, and moving objects are discussed in detail.

Coverage includes:

  • Origins of synthetic aperture radar
  • Ranging and imaging
  • Image formation and image processing tools
  • Linear frequency-modulated chirp
  • Image formation algorithms for quadrature demodulated data
  • Image formation algorithms for dechirped data
  • Autofocus
  • Image quality and speckle reduction
  • Linear frequency-modulated continuous wave systems
  • Remote sensing
  • Interferometry
  • Moving objects in SAR


Language:EnglishPublisher:McGraw-Hill CompaniesISBN-13:9781260458961ISBN-10:1260458962UPC:9781260458961Book Category:Technology & EngineeringBook Subcategory:Electrical, RadarSize:9.40 x 7.30 x 0.70 inchesWeight:1.2015Product ID:SCYTHD95CK
E. David Jansing Ph.D., is a Chief Engineer at Johns Hopkins University Applied Physics Laboratory, as well as a Lecturer at Johns Hopkins University Whiting School Engineering for Professionals Program. He has more than 20 years of experience in remote sensing, signal and image processing, data analysis, interpretation, modeling, and optimization.
Publisher: McGraw-Hill Companies

Contributor(s)

E. David Jansing

Author

E. David Jansing

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