High Resolution X-Ray Diffractometry And Topography - Paperback
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Language:EnglishPublisher:CRC PressISBN-13:9780367400637ISBN-10:367400634UPC:9780367400637Book Category:ScienceBook Subcategory:Physics, ChemistryBook Topic:Crystallography, Optics & LightSize:9.50 x 6.80 x 0.70 inchesWeight:0.9502Product ID:SCP0EZA3PE
High Resolution X-Ray Diffractometry And Topography
The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials...
Language:EnglishPublisher:CRC PressISBN-13:9780367400637ISBN-10:367400634UPC:9780367400637Book Category:ScienceBook Subcategory:Physics, ChemistryBook Topic:Crystallography, Optics & LightSize:9.50 x 6.80 x 0.70 inchesWeight:0.9502Product ID:SCP0EZA3PE
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