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Foundations of Measurement Volume II: Geometrical, Threshold, and Probabilistic Representations Volume 2

Foundations of Measurement Volume II: Geometrical, Threshold, and Probabilistic Representations Volume 2 - Paperback

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Availability:In StockContributor:David H. Krantz, R. Duncan Luce, Amos TverskySeries:Dover Books on Mathematics #2Publish date:2006-12-15Pages:512
Language:EnglishPublisher:Dover PublicationsISBN-13:9780486453156ISBN-10:486453154UPC:9780486453156Book Category:MathematicsBook Subcategory:MeasurementSize:8.46 x 6.34 x 1.05 inchesWeight:1.131Product ID:SC3FGVMJ0G
All of the sciences―physical, biological, and social―have a need for quantitative measurement. This influential series, Foundations of Measurement, established the formal foundations for measurement, justifying the assignment of numbers to objects in terms of their structural correspondence.
Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance.
Language:EnglishPublisher:Dover PublicationsISBN-13:9780486453156ISBN-10:486453154UPC:9780486453156Book Category:MathematicsBook Subcategory:MeasurementSize:8.46 x 6.34 x 1.05 inchesWeight:1.131Product ID:SC3FGVMJ0G
David H. Krantz is affiliated with Columbia University; R. Duncan Luce with the University of California, Irvine, and Patrick Suppes with Stanford University. Amos Tversky is deceased.
Publisher: Dover Publications

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