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Failure Analysis: High Technology Devices

Failure Analysis: High Technology Devices - Paperback

by Daniel J. D. Sullivan, Eric J. Carleton
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Availability:In StockContributor:Daniel J. D. Sullivan, Eric J. CarletonSeries:de Gruyter StemPublish date:2022-10-24Pages:128
Language:EnglishPublisher:de GruyterISBN-13:9781501524783ISBN-10:150152478XUPC:9781501524783Book Category:Technology & Engineering, ScienceBook Subcategory:Materials Science, Chemistry, ElectronicsBook Topic:Electronic Materials, AnalyticSize:9.61 x 6.69 x 0.28 inchesWeight:0.4806Product ID:SCV89K5BQY

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

Language:EnglishPublisher:de GruyterISBN-13:9781501524783ISBN-10:150152478XUPC:9781501524783Book Category:Technology & Engineering, ScienceBook Subcategory:Materials Science, Chemistry, ElectronicsBook Topic:Electronic Materials, AnalyticSize:9.61 x 6.69 x 0.28 inchesWeight:0.4806Product ID:SCV89K5BQY

Dr. Daniel J. D. Sullivan

attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, "Don't Date Crazy" by DJDS, and published a board game called Infection.

Dr. Eric J. Carleton

is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius...

Publisher: de Gruyter

Contributor(s)

Daniel J. D. Sullivan, Eric J. Carleton

Author

Daniel J. D. Sullivan, Eric J. Carleton

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