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Characterization of Wide Bandgap Power Semiconductor Devices

Characterization of Wide Bandgap Power Semiconductor Devices - Hardcover

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Availability:In StockContributor:Fei Wang, Zheyu Zhang, Edward A. JonesSeries:Energy EngineeringPublish date:2018-10-31Pages:347
Language:EnglishPublisher:Institution of Engineering & TechnologyISBN-13:9781785614910ISBN-10:1785614916UPC:9781785614910Book Category:Technology & EngineeringBook Subcategory:ElectronicsBook Topic:SemiconductorsSize:9.40 x 6.40 x 0.90 inchesWeight:1.5013Product ID:SCGDSG84R4

Characterization of Wide Bandgap Power Semiconductor Devices

Based on the authors' years of extensive experience, this is an authoritative overview of Wide Bandgap (WBG) device characterization. It provides essential tools to assist researchers, advanced students and practicing engineers in performing both static and dynamic characterization of WBG devices, particularly those based on using silicon carbide (SiC) and gallium nitride (GaN) power...

Series: Energy Engineering
Language:EnglishPublisher:Institution of Engineering & TechnologyISBN-13:9781785614910ISBN-10:1785614916UPC:9781785614910Book Category:Technology & EngineeringBook Subcategory:ElectronicsBook Topic:SemiconductorsSize:9.40 x 6.40 x 0.90 inchesWeight:1.5013Product ID:SCGDSG84R4
Wang, Fei: -

Fei (Fred) Wang is Professor of Electrical Engineering and Condra Chair of Excellence in Power Electronics, and Technical Director of NSF/DOE Engineering Research Center CURENT at The University of Tennessee, Knoxville, USA. He also holds a joint appointment with Oak Ridge National Lab. Prof. Wang has published over 400 journal and conference papers, authored 3 book chapters, and...

Publisher: Institution of Engineering & Technology

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