
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - Paperback
by Sarah Fearn
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Availability:In StockContributor:Sarah FearnSeries:Iop Concise PhysicsPublish date:2015-10-16Pages:66
Language:EnglishPublisher:Morgan & ClaypoolISBN-13:9781681740249ISBN-10:1681740249UPC:9781681740249Book Category:Technology & Engineering, ScienceBook Subcategory:Measurement, Materials Science, Scientific InstrumentsSize:10.00 x 7.00 x 0.18 inchesWeight:0.4012Product ID:SCWS59THN1
Language:EnglishPublisher:Morgan & ClaypoolISBN-13:9781681740249ISBN-10:1681740249UPC:9781681740249Book Category:Technology & Engineering, ScienceBook Subcategory:Measurement, Materials Science, Scientific InstrumentsSize:10.00 x 7.00 x 0.18 inchesWeight:0.4012Product ID:SCWS59THN1
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